\addvspace {10\p@ } \contentsline {figure}{\numberline {1.1}{\ignorespaces Hinode eclipse season.\relax }}{10}{figure.caption.4} \addvspace {10\p@ } \contentsline {figure}{\numberline {2.1}{\ignorespaces The Virtual Solar Observatory (VSO) main menu.\relax }}{15}{figure.caption.8} \contentsline {figure}{\numberline {2.2}{\ignorespaces Search form generated after selecting the \textbf {Instrument / Source / Provider} box on the main VSO website. Hinode XRT data is provided by SAO.\relax }}{16}{figure.caption.9} \contentsline {figure}{\numberline {2.3}{\ignorespaces VSO form describing the data available given the search parameters. The \textbf {CheckBox Tools} menu in the left column can be helpful when selecting a large amount of data.\relax }}{17}{figure.caption.10} \contentsline {figure}{\numberline {2.4}{\ignorespaces VSO Data request page.\relax }}{18}{figure.caption.11} \contentsline {figure}{\numberline {2.5}{\ignorespaces Hinode Science Data Center Europe Archive Search page. Search parameters relevant to XRT are highlighted green in this image.\relax }}{19}{figure.caption.12} \contentsline {figure}{\numberline {2.6}{\ignorespaces Example search results from the Hinode SDC Europe Archive.\relax }}{20}{figure.caption.13} \contentsline {figure}{\numberline {2.7}{\ignorespaces Lockheed Martin Solar \& Astrophysics Laboratory's Sungate website.\relax }}{21}{figure.caption.14} \contentsline {figure}{\numberline {2.8}{\ignorespaces LMSAL Solarsoft XRT catalog webpage.\relax }}{22}{figure.caption.15} \contentsline {figure}{\numberline {2.9}{\ignorespaces Effect of contamination layer, accumulating on the CCD between a bakeout and the next, on the XRT temperature response of Al\_mesh (black curves), C\_poly (red curves), and Be\_thin (blue curves). The solid lines are responses calculated for 2009-09-24, right after a CCD bakeout, and the dashed curves are calculated for 2009-10-15, i.e.\ three weeks later and just before the following bakeout. The comparison shows that in the regime of regular bakeouts, adopted since mid-2008, only the thinnest filter shows any detectable, though minimal, change in response due to accumulation of contaminating material on the CCD between bakeouts.\relax }}{37}{figure.caption.25} \contentsline {figure}{\numberline {2.10}{\ignorespaces An example Al\_mesh image taken on 5-August-2010 at 10:01UT. \emph {Left}: The prepped data without spot correction. \emph {Right}: The output image from the routine \textbf {xrt\_spotcor.pro}. The severity of the spots depends on wavelength with the Al\_mesh filter being most affected. Spot correction can be done from within \textbf {xrt\_prep.pro} and a spot map should be generated to locate affected pixels.\relax }}{38}{figure.caption.26} \contentsline {figure}{\numberline {2.11}{\ignorespaces Comparison of Ti\_poly images before and after light leak.\relax }}{40}{figure.caption.29} \contentsline {figure}{\numberline {2.12}{\ignorespaces Examples displaying XRT data in IDL.\relax }}{42}{figure.caption.30} \contentsline {figure}{\numberline {2.13}{\ignorespaces Sample coalignment between XRT and AIA images using \textbf {plot\_map}. XRT images are on the left and AIA on the right. \emph {Upper Left}: XRT Map using level-0 FITS header information without correction. \emph {Lower Left}: Same data after the correction done by xrt\_read\_coaldb.pro. The image location has changed relative to the $x$ and $y$ axes. The red contour in the right panel show the position of the flaring loop in XRT images.\relax }}{46}{figure.caption.31} \contentsline {figure}{\numberline {2.14}{\ignorespaces The total telescope throughput of the XRT for each of the nine X-Ray filter channels. \emph {Figure 17 from \cite {Golub07}}.\relax }}{54}{figure.caption.32} \contentsline {figure}{\numberline {2.15}{\ignorespaces Example of XRT temperature responses calculated for two different dates. The solid lines are responses calculated for 2007-03-01, before the first CCD bakeout, and the dashed curves are calculated for 2008-03-01, in the regime of regular bakeouts. The comparison shows how the sensitivity in the lower energy range, significantly decreased by the contamination material, has been recovered through CCD bakeout and maintained with regular CCD bakeouts.\relax }}{62}{figure.caption.33} \contentsline {figure}{\numberline {2.16}{\ignorespaces Example of XRT temperature responses calculated using the default spectrum for AIA and a standard XRT spectrum: the solid lines are the responses calculated for the standard XRT spectrum, and the dashed curves are calculated using the default spectrum for AIA. Both are calculated for the date 2011 August 21.\relax }}{67}{figure.caption.34} \contentsline {figure}{\numberline {2.17}{\ignorespaces Example temperature output from \textbf {xrt\_teem.pro} using Al\_mesh and Al\_poly filters. The units have been changed from $\mathop {\mathgroup \symoperators log}\nolimits $ K to Million K.\relax }}{70}{figure.caption.35} \contentsline {figure}{\numberline {2.18}{\ignorespaces Example emission measure output from \textbf {xrt\_teem.pro} using the Al\_mesh and Al\_poly filters.\relax }}{71}{figure.caption.36} \contentsline {figure}{\numberline {2.19}{\ignorespaces Example output from \textbf {xrt\_deconvolve} with and without using a saturation mask.\relax }}{81}{figure.caption.37} \addvspace {10\p@ } \contentsline {figure}{\numberline {3.1}{\ignorespaces XRT filter wheels as viewed from the sun.\relax }}{87}{figure.caption.44} \addvspace {10\p@ }